Semiconductor Nanocrystals and Silicate Nanoparticles | ISBN 9783540278054

Semiconductor Nanocrystals and Silicate Nanoparticles

herausgegeben von Xiaogang Peng und David Michael P. Mingos
Mitwirkende
Herausgegeben vonXiaogang Peng
Beiträge vonA.J. Bard
Herausgegeben vonDavid Michael P. Mingos
Beiträge vonZ. Ding
Beiträge vonP. Guyot-Sionnest
Beiträge vonF. Liebau
Beiträge vonN. Myung
Beiträge vonX. Peng
Beiträge vonD. Santamaría-Pérez
Beiträge vonJ. Thessing
Beiträge vonA. Vegas
Buchcover Semiconductor Nanocrystals and Silicate Nanoparticles  | EAN 9783540278054 | ISBN 3-540-27805-2 | ISBN 978-3-540-27805-4

„Studies of semiconductor nanocrystals remain a key component in the repertoire of materials chemistry. As these materials enjoy sustained relevance to applications in optoelectronic materials and biological labeling, updated, in-depth reviews of their fundamental properties continue to be a valuable resource to those interested in the field.

... this volume in the longstanding Structure and Bonding series is a useful compilation of up-to-date reviews regarding semiconductor nanocrystals, especially those of the often-studied II-VI variety. It also continues its tradition of choosing respected scientists in the field that produce lucid papers of value.“

 

from: Jeffery L. Coffer, Texas Christian University, J. Am. Chem. Soc. 2006, 128, 9258

Semiconductor Nanocrystals and Silicate Nanoparticles

herausgegeben von Xiaogang Peng und David Michael P. Mingos
Mitwirkende
Herausgegeben vonXiaogang Peng
Beiträge vonA.J. Bard
Herausgegeben vonDavid Michael P. Mingos
Beiträge vonZ. Ding
Beiträge vonP. Guyot-Sionnest
Beiträge vonF. Liebau
Beiträge vonN. Myung
Beiträge vonX. Peng
Beiträge vonD. Santamaría-Pérez
Beiträge vonJ. Thessing
Beiträge vonA. Vegas
Presents critical reviews of the present position and future trends in modern chemical research concerned with chemical structure and bonding Short and concise reports, each written by the world's renowned experts Still valid and useful after 5 or 10 years More information as well as the electronic version of the whole content available at: springerlink. com